Gyungtae Kim is a principal researcher at the National Nanofab Center in the Department of Measurement & Analysis, specializing in nanoscale characterization and surface analysis. Born on July 17, 1977, in South Korea, he earned his Ph.D. in Electronics, Radio Sciences & Engineering and Information Communications from Chungnam National University in February 2016. He has extensive experience in the semiconductor industry, having worked as a senior engineer at SK Hynix from 2004 to 2011 before joining the National Nanofab Center. Over his 13-year research career, he has contributed significantly to the field of semiconductor metrology, with key expertise in surface and X-ray analysis. His research has resulted in numerous publications in high-impact journals and involvement in several high-profile projects. Gyungtae is also an active member of several academic committees and has presented his work at major international conferences.
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Suitability for Excellence in Research Award: Gyungtae Kim
Gyungtae Kim is a highly qualified researcher with extensive experience in the field of nanoscale characterization. His educational background, professional experience, and significant contributions to research and development make him a strong candidate for the Excellence in Research Award.
🎓Education:
Gyungtae Kim holds a Ph.D. in Electronics, Radio Sciences & Engineering and Information Communications from Chungnam National University, completed in February 2016. His doctoral thesis, titled “Reliable Electro-Thermal Modeling and Characterization for Highly Uniform Amorphous-Silicon Microbolometer,” was supervised by Prof. Hyoungho Ko. Prior to his Ph.D., he earned a Master’s degree in the same field from Chungnam National University in February 2014. He also holds a Bachelor’s degree in Electronics Engineering from Inha University, which he completed in February 2004.
🏢Work Experience:
Gyungtae Kim is a Principal Researcher in the Department of Measurement & Analysis at the National Nanofab Center, a position he has held since 2016. His key experiences in this role include surface analysis, X-ray analysis, and semiconductor metrology. Prior to this, he served as a Senior Researcher in the Semiconductor Device Department at the same institution from 2011 to 2016. Before joining the National Nanofab Center, Gyungtae worked as a Senior Engineer at SK Hynix from 2004 to 2011, where he gained substantial industry experience.